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BGA200 LPDDR4 Tester
BGA200 LPDDR4 Tester

BGA200 LPDDR4 Tester

The BGA200 LPDDR4 tester is designed for BGA200 IC chip function test. LPTest Patterns include RD test, WR test, Self Refresh test, Address test, Moving inversions, Block move, Bit fade test, Random number sequence, RH test, Scan test, etc.

  • Application： BGA
  • Nb of Pins： 200
  • Pitch： 0.65mm

BGA200 LPDDR4 Tester

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1498021773838812.gif FT level test platform

1498021773838812.gif Apply to BGA200 LPPDDR4 & LPDDR4x test

1498021773838812.gif A good algorithm is used in the test program

1498021773838812.gif Suitale for BGA200 IC chips from Micron, Samsung, etc.


  Sireda Technology|Test Socket|test fixture

Sireda Technology|Test Socket|test fixture

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  • 3 Models for 2GB, 3GB, 4GB are provided with different densities.

  • Ultra-low-voltage core and I/O power supplies

          - VDD1 = 1.70~1.95V; 1.80V nominal

          - VDD2 = 1.06~1.17V; 1.10V nominal

          - VDDQ = 0.57~0.65V; 0.60V nominal

         or VDDQ = 1.06~1.17V; 1.10V nominal

  • Frequency range - 1866~10MHz (date rate range per pin: 3733~20 Mb/s)

  • Test cycle time is aroung 15~20 mins for 2GB density, and longer with 3GB and 4GB density.

  • A small display shows the immediate testing status.

  • Easy operation (only need to connect to power by a type C cable) and easy maintenance. 

  • Support hot plug.

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Mechanical 

Material Socket Body：　              AL, PEI

Material Socket Lid：　　              AL, PEI

Contact：                                    PCR elastmer

Operation Temperature:　　         -25 ~ 85 ℃

Life Span:                                    50K Cycles

Spring Force:　                            20g ~ 30g per Pin


Electrical

Current Rating：　　                   2A

DC Resistance：                          Max. 100mΩ

BGA200 LPDDR4 Tester

  • The BGA200 LPDDR4 tester is designed for BGA200 IC chip testing.

  • It is FT testing for BGA200 packaging used in Smart phone, tablet computer, smart computer, set-top box, smart speaker, dash cam, smart camera, etc. 

  • LPTest Patterns: RD test, WR test, Self Refresh test, Address test, Moving inversions, Block move, Bit fade test, Random number sequence, RH test, Scan test, etc.

  • If you are interested in our BGA200 LPDDR4 tester, or if you have doubts, please send us email to sales@sireda.com. 

 Sireda Technology|Test Socket|test fixture


label: BGA200 test BGA200 LPDDR test BGA200 LPDDRx test BGA200 function test

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