Automatic Test (ATE) Socket
Apply for automatice test, validation test of UFS, eMMC, eMCP, DDR, Nand, etc System level or Functional test Pitch can be as small as 0.35mm |
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ATE test socket is designed for Automatic test of IC devices like CPU, eMMC, eMCP, DDR, Nand, etc. Socket structure can be designed according to customer's application, can be Open top type or ATE machine type. Open Top (OT) test socket is mainly for burn in test. ATE test socket is suitalbe for different IC package of BGA, LGA, QFP, QFN, SOP, and so on. With 15+ years of experience, socket can be design according to customer's specific requirements of frequency, current, resistance, etc. Floating design provide better contact and protect DUT from damage.
| Mechanical Material Socket Body: Peek Ceramic/Torlon/PPS Material Socket Lid: AL,POM Contact: Pogo Pin Operation Temperature: -40 ~ 140 ℃ Life Span: 100K Cycles Spring Force: 20g ~ 30g per Pin
Electrical Current Rating: 3A DC Resistance: Max. 100mΩ
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Part Number | Name | Description | Package | Pin Nb | Material | Remarks |
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702-0000025 | Test Socket | QFN48 0.4mm CT 6x6mm B | QFN | 48 | Peek Ceramic | ATE |
702-0000883 | Test Socket | SOP24 0.65mm NA ATE 4.4x7.8mm | SOP | 24 | Peek Ceramic | ATE |
702-0000933 | Test Socket | LGA24 0.5mm GSL6101 ATE 3x3mm | LGA | 24 | PPS | ATE |
702-0000625 | Test Socket | DFN8 1.0mm NA OT 4x4.2mm | DFN | 8 | Peek Ceramic | Open Top |
702-0000684 | Test Socket | BGA12 0.5mm NA OT 2x2.2mm | BGA | 12 | PPS | Open Top |
Sireda provide automatic test (ATE) socket for IC packages of BGA, LGA, QFN, QFP, SOP, etc. More ATE socket please visit Automatic Test (ATE) Socket List. For more information, please contact sales@sireda.com